Books written by Electrochemical Society. Meeting
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Environmental Issues in the Electronics and Semiconductor Industries: Proceedings of the Second International Symposium
... Brad Baker , Ai Koh , Mike Lindell , Lloyd Gonzales , Benny Perez , Fred Huang , Tom Lii , Mark Kruse , Paul Thomas Brown , Laura Mendicino , Richard Darrington , Ralph Garza , Tam Vuong SEMATECH : Walter Worth Litmas : Curtis Camus ...
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Lithium and Lithium-ion Batteries: Proceedings of the International Symposium
X. Zhang , J. K. Pugh and P. N. Ross , J. Electrochem . Soc . , 148 , E183 ( 2001 ) . 28. M. Moshkovic , M. Cojocaru , H.E. Gottlieb , and D. Aurbach , J. Electroanal . Chem . 2001 , 497 , 84 . 29. F. Joho and P. Novak , Electrochim .
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Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors
30 , 31 ( 1994 ) [ 22 ] G.C. Dente , Proceedings Society of Photo - Optical Instrumentation Engineers 2382 , 165 ( 1995 ) ( 23 ] D.M. Pepper and R.R. Craig , U.S. Patent no . 4,803,696 ( 1989 ) [ 24 ] T. Suhara and H. Nishihara ...
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Pits and Pores III: Formation, Properties, and Significance for Advanced Materials : Proceedings of the International Symposium
Dr. Yu . Kuznecov for helpful discussion . REFERENCES 1. A.G. Keenan , Ch.A. Webb , K.G. Kompton and D.A. Kramer , J. Electrochem . Soc . , 123 , 179 ( 1976 ) . 2 . S.G. Byallozor , Russian Electrochemistry , 16 , 1578 ( 1980 ) . 3.
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Spectroscopic Tools for the Analysis of Electrochemical Systems: Proceedings of the International Symposium
Proceedings of the International Symposium Electrochemical Society. Physical Electrochemistry Division, Electrochemical Society. Meeting James McBreen, Daniel Scherson. IN SITU INFRARED SPECTROSCOPY ON ELECTRODE SURFACES G.L.J. ...
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Environmental Issues in the Electronics/semiconductor Industries and: Electrochemical/photochemical Methods for Pollution Abatement
Environmental Issues in the Electronics/semiconductor Industries and: Electrochemical/photochemical Methods for Pollution Abatement
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Pits and Pores II: Formation, Properties, and Significance for Advanced Materials : Proceedings of the International Symposium
H. Böhni and F. Hunkeler , Electrochimica Acta , 32 ( 1987 ) 615 4. H. Lajain , Werkstoffe und Korrosion ... St. Matsch and H. Böhni : in Critical Factors in Localized Corrosion III , Electrochem . Soc . PV 98-17 ( 1998 ) , p . 421 12.
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Silicon-on-insulator Technology and Devices XI: Proceedings of the International Symposium
Silicon-on-insulator Technology and Devices XI: Proceedings of the International Symposium
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Advanced Short-time Thermal Processing for Si-based CMOS Devices: Proceedings of the International Symposium
-2 2 DOOTA SPEG : B * , 500 eV , 1E 15 cm o SPEG : BF , : 2.2 keV , 1E 15 cm SPEG : BF ,: 4.5 keV , 1E 15 cm Spike : BF7 , 1.1 keV , 1E 15 cm Spike : BF , : 2.2 keV , 1E 15 cm 2 -2 1000 Sheet resistance ( 2 / sq . ) Boxc .
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Low Temperature Electronics and Low Temperature Cofired Ceramic Based Electronic Dvices: Joint Proceedings of the Seventh International Symposium on Low...
17th Symp . on Microelectronics Technology and Devices - SBMicro 2002 , N.I. Morimoto , R.P. Ribas and P. Verdonck ( Eds ) , The Electrochemical Soc . , PV 2002-8 , 455 ( 2002 ) . [ 53 ] J. Welser , J.L. Hoyt and J.F. Gibbons , in IEDM ...
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Silicon-on-Insulator Technology and Devices X: Proceedings of the Tenth International Symposium on Silicon-on-Insulator Technology
[ 10 ] J. P. Colinge , Silicon - On - Insulator Technology : Materials to VLSI , 2nd Edition , p . 163 , Kluwer Academic Publishers , Boston , MA ( 1997 ) . [ 11 ] P. F. Lu et al . , Proceedings of the 1996 IEEE Symposium on Low Power ...
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Functionalized Fullerenes: Proceedings of the International Symposium
... Tetrahedron 1996 , 52 , 5149-5159 . c ) F. Arias , Y. Yang , L. Echegoyen , Q. Lu , S. R. Wilson in * Proceedings of the Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials ' ( Volume 2 ) ...
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High Purity Silicon: Proceedings of the ... International Symposium
High Purity Silicon: Proceedings of the ... International Symposium
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Meeting Abstracts
Meeting Abstracts
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Thin Film Materials, Processes, and Reliability: Proceedings of the International Symposia
Thin Film Materials, Processes, and Reliability: Proceedings of the International Symposia
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ULSI Process Integration II: Proceedings of the International Symposium
... microelectronics heterostructure devices did not play an important role . This was caused partly by technical reasons ... V compounds are dopants in Si , and vice versa . The electronically compatible groups IV materials diamond and ...
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Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing
Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing