Semiconductor Fundamentals
- ISBN-10
- 0201053209
- ISBN-13
- 9780201053203
- Category
- Technology & Engineering / Electronics / Semiconductors
- Pages
- 126
- Language
- English
- Published
- 1983
- Publisher
- Addison-Wesley
- Author
- Robert F. Pierret
Get the book
Other editions
Similar books
-
Introduction to Laser Diode-pumped Solid State Lasers
By Richard SchepsThis text covers a wide range of material, from the basics of laser resonators to advanced topics in laser diode pumping. The subject matter is presented in descriptive terms that...
-
半导体封装测试制造系统运行优化理论与技术
By 倪妍婷著本著作从系统化、协同化的角度构建适合半导体封装测试生产自身特点的协同体系结构，运用分布式人工智能技术中的多智能体对该系统进行模块化封装，对生产计划与调度中的具体问题进行建模，研究生产协同过程中的关键技术和协商机制，并进行协商优化。
-
Power Integrity Modeling and Design for Semiconductors and Systems
By Madhavan Swaminathan, A. Ege EnginMadhavan Swaminathanreceived his B.E. in Electronics and Communication from Regional Engineering College, Tiruchirapalli in 1985 and his M.S. and Ph.D. degrees in Electrical Engineering from Syracuse University in 1989 and...
-
Advanced Theory of Semiconductor Devices
By Karl HessElectrical Engineering Advanced Theory of Semiconductor Devices Semiconductor devices are ubiquitous in today’s world and are found increasingly in cars, kitchens and electronic door locks, attesting to their presence in...
-
Introduction to Electronic Devices
By Michael ShurThis book gives readers enough knowledge of the required principles so they can adapt the knowledge to new materials and types of devices. As device dimensions shrink and more exotic...
-
2000 IEEE International Symposium on Compound Semiconductors: Proceedings of the IEEE Twenty-Seventh International Symposium on Compound Semiconductors : Held in...
By IEEE Electron Devices SocietyThis text constitutes the proceedings from the 25th IEEE International Symposium on Compound Semiconductors, which took place in 2000. Topics covered include emitter science and technology, heterostructure devices and quantum...
-
Characterization and Metrology for ULSI Technology: 2003: 2003 International Conference on Characterization and Metrology for ULSI Technology
By David G. Seiler, Robert McDonald, Alain C. DieboldThe worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm and beyond. The magnitude of these challenges demands...
-
Fundamentals of Novel Oxide/semiconductor Interfaces: Symposium Held December 1-4, 2003, Boston, Massachusetts, U.S.A
By C. R. AbernathyFundamentals of Novel Oxide/semiconductor Interfaces: Symposium Held December 1-4, 2003, Boston, Massachusetts, U.S.A
-
Silicon Materials Science and Technology: Proceedings of the Eighth International Symposium on Silicon Materials Science and Technology
By Howard R. Huff, U. Gösele, H. TsuyaM. Hourai , S. Sadamitsu , K. Murakami , T. Shigematsu and N. Fujino , in Defect Control in Semiconductors / 1990 ... M. Seibt , in Crystalline Defects and Contamination : Their Impact and Control in Device Manufacturing II / 1997 ...
-
Principles of Growth and Processing of Semiconductors
By Subhash Mahajan, K. S. SreeHarsha, K. S. Sree HarshaA senior/graduate text on the growth and processing of semiconductor materials (semiconductor fabrication) that will expose material/electrical and chemical engineering majors to the principles underlying the fabrication of state-of-the-art integrated...