X-Ray Spectrometry: Recent Technological Advances

X-Ray Spectrometry: Recent Technological Advances
ISBN-10
0470020423
ISBN-13
9780470020425
Category
Science
Pages
616
Language
English
Published
2005-08-19
Publisher
John Wiley & Sons
Authors
Rene Van Grieken, Kouichi Tsuji, Jasna Injuk

Description

X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.

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