A comprehensive guide to MEMS materials, technologies and manufacturing, examining the state of the art with a particular emphasis on current and future applications. Key topics covered include: Silicon as MEMS material Material properties and measurement techniques Analytical methods used in materials characterization Modeling in MEMS Measuring MEMS Micromachining technologies in MEMS Encapsulation of MEMS components Emerging process technologies, including ALD and porous silicon Written by 73 world class MEMS contributors from around the globe, this volume covers materials selection as well as the most important process steps in bulk micromachining, fulfilling the needs of device design engineers and process or development engineers working in manufacturing processes. It also provides a comprehensive reference for the industrial R&D and academic communities. Veikko Lindroos is Professor of Physical Metallurgy and Materials Science at Helsinki University of Technology, Finland. Markku Tilli is Senior Vice President of Research at Okmetic, Vantaa, Finland. Ari Lehto is Professor of Silicon Technology at Helsinki University of Technology, Finland. Teruaki Motooka is Professor at the Department of Materials Science and Engineering, Kyushu University, Japan. Provides vital packaging technologies and process knowledge for silicon direct bonding, anodic bonding, glass frit bonding, and related techniques Shows how to protect devices from the environment and decrease package size for dramatic reduction of packaging costs Discusses properties, preparation, and growth of silicon crystals and wafers Explains the many properties (mechanical, electrostatic, optical, etc), manufacturing, processing, measuring (incl. focused beam techniques), and multiscale modeling methods of MEMS structures
Developments in Surface Contamination and Cleaning: Methods for Surface Cleaning, Volume 9, part of the Developments in Surface Contamination and Cleaning series provide a state-of-the-art guide to the current knowledge on the behavior of ...
M. Tilli, M. Paulasto-Krockel, M. Petzold, H. Theuss, T. Motooka, and V. Lindroos,Handbook of silicon based MEMS materials and technologies. Elsevier, 2020. 44. A. M. Elshurafa, K. N. Salama, and P. Ho, “Modeling and fabrication of an ...
The book also: Provides a comprehensive catalog of various microfabrication processes, each with a brief introduction to the technology, as well as examples of common uses in MEMS Discusses specific MEMS fabrication techniques such as ...
[2] V. Lindroos, M. Tilli, A. Lehto, T. Motooka, Handbook of Silicon Based MEMS Materials and Technologies (Micro and Nano Technologies), William Andrew, 2010. [3] J. Park, K. Kwack, Crystal Originated Particle Induced Oxide Breakdown ...
Materials, Technologies, Systems, and Applications Werner Zapka ... Adhesion mechanisms of nanoparticle silver to substrate materials: identification. ... In Handbook of Silicon Based MEMS Materials and Technologies, pp. 531–545.
References [1] V. Lindroos, M. Tilli, A. Lehto and T. Motooka, Handbook of Silicon Based MEMS Materials and Technologies, Oxford, Elsevier, 2010. [2] B. Lawn, Fracture of brittle solids, Cambridge University Press, 1993.
For the low carbon concentrations used to control dopant diffusion, the energy barrier is still large enough to suppress any ... A major challenge for the fabrication of ultrasmall devices for next silicon technology generations is the ...
[80] F. Laermer, S. Franssila, L. Sainiemi, and K. Kolari, “Chapter 21: Deep reactive ion etching,” in Handbook of Silicon Based MEMS Materials and Technologies, M. Tilli, T. Motooka, V.-M. Airaksinen, S. Franssila, M. Paulasto-Kröckel, ...
EPSMA (2005), Guidelines to Understanding Reliability Prediction, Report of the European Power Supply ... Pecht M G, Radojcic R, and Rao G (1999), Guidebook for Managing Silicon Chip Reliability, CRC Press, Boca Raton, FL, USA.
Exposure to low energy ions in a plasma, which would not normally remove the native surface material, ... 26, Handbook of Silicon Based MEMS Materials and Technologies, edited by V. Lindroos et al., Elsevier, Amsterdam, pp.