Handbook of Charged Particle Optics

Handbook of Charged Particle Optics
ISBN-10
0849325137
ISBN-13
9780849325137
Category
Science
Pages
532
Language
English
Published
1997-06-25
Publisher
CRC Press
Author
Jon Orloff

Description

This timely handbook contains chapters on the essential elements of high resolution charged particle optics and is written by many of the world's leading research scientists. It is a complete guide to understanding, designing, and using high resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This handbook is evenly balanced between theory and application, and covers all the most important topics in this growing area. Handbook of High Resolution Charged Particle Optics explains how and why high resolution instruments work and how to apply this information when designing or using them.

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