Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
ISBN-10
1461502152
ISBN-13
9781461502159
Series
Scanning Electron Microscopy and X-Ray Microanalysis
Category
Technology & Engineering
Pages
689
Language
English
Published
2012-12-06
Publisher
Springer Science & Business Media
Authors
Joseph Goldstein, Linda Sawyer, Dale E. Newbury

Description

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

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