This issue covers in detail all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high dielectric constant materials, processing, metals for gate electrodes, interfaces, physical, chemical, and electrical characterization, gate stack reliability, and DRAM and non-volatile memories.
Digest of Literature on Dielectrics: 1977
Y. Senzaki , S. G. Park , R. Higuchi , L. Bartholomew , H. Chatham , S. Al - Lami , C. Barelli , S.-I. Lee , A. Helms , Jr. , in Advanced Short - Time Thermal Processing for SiBased CMOS Devices / 2003 , F. Roozeboom , E. Gusev , L.-J.
It is necessary to know something about the chemical bonding holding atoms together to form molecules and the interactions of molecules in order to have some understanding of matter.
Digest of Literature on Dielectrics: 1976
Digest of Literature on Dielectrics
... Tetrahedron 1996 , 52 , 5149-5159 . c ) F. Arias , Y. Yang , L. Echegoyen , Q. Lu , S. R. Wilson in * Proceedings of the Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials ' ( Volume 2 ) ...
Dielectrics in Emerging Technologies and Persistent Phosphors: Joint Proceedings of the International Symposia
Berechnung feldinduzierter Ströme und Stromdichten in Modellen des menschlichen Körpers im Frequenzbereich 10 Hz bis 30 MHz
This issue covers, in detail, all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high dielectric constant materials, processing, metals for gate electrodes, interfaces, ...
... Flame Retardancy Conference , May 24-26 , 1999 , Stamford , CT . Bukowski , R.W. , " Toxic Hazard Analysis of Plenum Cables " , Fire Technology , Vol . 21 , No. 4 , pp 252-266 , ( 1985 ) . Hirschler , M.M. , " First Order Evaluation of Fire ...