ToF-SIMS: Materials Analysis by Mass Spectrometry
- ISBN-10
- 1906715173
- ISBN-13
- 9781906715175
- Category
- Mass spectrometry
- Pages
- 742
- Language
- English
- Published
- 2013
- Publisher
- IM Publications
- Authors
- David Briggs, J. C. Vickerman
Description
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
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