Defects In Insulating Materials - Proceedings Of The Xii International Conference (In 2 Volumes)
- ISBN-10
- 9814553468
- ISBN-13
- 9789814553469
- Pages
- 1420
- Language
- English
- Published
- 1993-06-18
- Publisher
- World Scientific
- Authors
- O Kanert, J-m Spaeth
Description
Introduction Scanning tunneling microscopy (STM) has provided spectacular new views of surface atomic structure including point defects on semiconductors and metals. However, alkali halides and other ionic insulators which exhibit such ...
