Advances in Imaging and Electron Physics
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Advances in Imaging and Electron Physics
By Peter W. HawkesConstructions related to the skeleton, such as the cut locus, had been considered in the literature prior to Blum's work. However, Blum's eVorts revitalized interest in such descriptions and led to subsequent studies on the properties ...
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Advances in Imaging and Electron Physics
By Peter W. HawkesV. MACKAY–NEAL CODES MacKay–Neal (MN) codes were introduced in 1995 as a variation on Gallager codes. As in the case of Gallager codes (see Section IV), MN codes are defined by two very sparse matrices, but with the difference that ...
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Advances in Imaging and Electron Physics: Electron Emission Physics
By Kevin JensenThis thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC.
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Advances in Imaging and Electron Physics
By Peter W. HawkesSikharulidze, I., van Gastel, R., Schramm, S., Abrahams, J. P., Poelsema, B., Tromp, R. M., & van der Molen, S.J. (2011). Low energy electron microscopy imaging using Medipix2 detector. Nuclear Instruments and Methods in Physics ...
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Advances in Imaging and Electron Physics
By Peter W. HawkesMcMorran, B. J., Agrawal, A., Anderson, I. M., Herzing, A. A., Lezec, H. J., McClelland, J.J., & Unguris, J. (2011). Electron vortex beams with high quanta of orbital angular momentum. Science, 331(6014), 192–195.
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Advances in Imaging and Electron Physics
By Peter W. HawkesDonovan, G. C., Geronimo, J. S., and Hardin, D. P. (1995). A class of orthogonal multiresolution analyses in 2D, in Mathematical Methods for Curves and Surfaces, edited by M. Daehlen, T. Lyche, and L. L. Schumaker.
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Advances in Imaging and Electron Physics
By Jr., Jay Theodore CremerRequirements for X-ray fluorescence. In Handbook of Optics, Third Edition Volume V: Atmospheric Optics, Modulators, Fiber Optics, X-Ray and Neutron Optics Bass, C. MacDonald, G. Li, C. DeCusatis, V. Mahajan, Eds.) (Chapter 29).
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Advances in Imaging and Electron Physics
Techniques for minimizing space proton damage in scientific charge-coupled devices, IEEE Trans. Nuclear Sci. 38(6), 1663–1670. Hopkins, I. H., Hopkinson, G. R., and Johlander, B. (1994). Proton-induced charge transfer degradations in ...
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Advances in Imaging and Electron Physics
By Peter W. HawkesThis series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...
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Advances in Imaging and Electron Physics
The power of ion mobility- mass spectrometry for structural characterization and the study of conformational ... Ion mobility spectrometry-mass spectrometry (IMS-MS) of small molecules: Separating and assigning structures to ions.
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Advances in Imaging and Electron Physics
Proceedings of the Institute of Physics Electron Microscopy and Analysis Group and Royal Microscopical Society ... EMAG 1999. Electron Microscopy and Analysis 1999. Proceedings of EMAG 99, University of Sheffield, 25–27 August 1999 ...
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Advances in Imaging and Electron Physics
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...
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Advances in Imaging and Electron Physics
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...
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Advances in Imaging and Electron Physics
By Peter W. HawkesThis Book looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application.
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...
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Advances in Imaging and Electron Physics: Optics of Charged Particle AnalyzersVolume 157 of Advances in Imaging and Electron Physics
By Mikhail YavorThis series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...
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Advances in Imaging and Electron Physics
By Peter W. HawkesThis series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...
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Advances in Imaging and Electron Physics
By Peter W. HawkesThis series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...
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Advances in Imaging and Electron Physics: Silicon-Based Millimetre-wave Technology
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...
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Advances in Imaging and Electron Physics: Advances in Electron Microscopy and Diffraction
By Peter W. HawkesThe series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave ...